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CSP Underfill, Processing and Reliability

机译:CSP底层,加工和可靠性

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The use of Chip Scale Packaging (CSP) is rapidly expanding, particularly in portable electronic products. Many CSP designs will meet the thermal cycle or thermal shock requirements for these applications. However, mechanical shock and bending requirements often necessitate the use of underfills to increase the mechanical strength of the CSP-to-board connection. This paper examines the assembly process with capillary and fluxing underfills. Issues of solder paste versus flux only, solder flux residue cleaning and reworkability are investigated with the capillary flow underfills. Fluxing underfills eliminate the issues of flux-underfill compatibility, but require placement into a predispensed underfill. Voiding during placement is discussed. To evaluate the relative performance of the underfills, a drop test was performed and the results are presented. All of the underfills significantly improved the reliability in the drop test compared to non-underfilled parts. Processes such as cleaning or rework that improved the adhesion of the underfill to the PWB solder mask further improved drop test reliability.
机译:使用芯片刻度包装(CSP)正在快速扩展,特别是在便携式电子产品中。许多CSP设计将满足这些应用的热循环或热冲击要求。然而,机械冲击和弯曲要求通常需要使用底部填充物来增加CSP到板连接的机械强度。本文介绍了毛细管和助焊底部填充物的装配过程。仅使用毛细管流量底部填充物研究焊膏与焊剂与焊剂的问题,焊剂残留清洁和再加工性。助熔剂底部填充消除了助焊剂填充性兼容性的问题,但需要放置到易受填充的底部填充物中。讨论了放置期间的空缺。为了评估底部填充物的相对性能,进行了滴度测试,并提出了结果。与非欠底件部件相比,所有底部填充物显着提高了下降试验的可靠性。诸如清洁或返工的方法,其改善了底部填充物到PWB焊接掩模的粘附性进一步提高了下降测试可靠性。

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