首页> 外文会议>Pacific Rim/International, Intersociety Electronic Packaging Technical/Business Conference Exhibition >Analytic model for temperature-dependent I-V characteristics and small-signal parameters of GaAs MESFETs
【24h】

Analytic model for temperature-dependent I-V characteristics and small-signal parameters of GaAs MESFETs

机译:GaAs Mesfet的温度依赖I-V特性的分析模型和小信号参数

获取原文

摘要

In this paper a 2-D T-V MESFET model coupled with a 3-D thermal model is presented. The temperature dependence of the velocity-electric field expression proposed by Chang et al. [1] has been considered so as to evaluate the device characteristics and small-signal parameters at the actual channel temperature. The effect of the device self-heating has been included by a coupled electrothermal simulation. The thermal dependence of all physical parameters involved both in the electric model and in the thermal model has been taken into account.
机译:本文提出了一种与3-D热模型耦合的2-D T-V MESFET模型。 Chanc等人提出的速度电场表达的温度依赖性。已经考虑了[1]以便在实际通道温度下评估器件特性和小信号参数。通过耦合电热模拟包括装置自加热的效果。已经考虑了电模型和热模型中涉及的所有物理参数的热依赖性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号