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Silicon Nanowire Fabrication Using Novel Hydrogenation-Assisted Deep Reactive Ion Etching

机译:使用新型氢化辅助深反应离子蚀刻的硅纳米线制造

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A novel method for the fabrication of silicon nanostructures on silicon substrates is reported. This technique relies on a hydrogenation-assisted high aspect ratio plasma etching of silicon substrates capable of producing nanowires and microstructures. The deep vertical etching process consists of sequential oxygen-passivation and SF{sub}6-etching of silicon at a record low density plasma of 0.25-0.5W/cm{sup}2 (150-300W over an area of 20×30cm{sup}2). A concurrent hydrogenation has been used to stimulate the vertical removal of the silicon substrate without damaging the sidewalls [1].
机译:报道了一种用于在硅基衬底上制造硅纳米结构的新方法。该技术依赖于能够产生纳米线和微结构的硅基衬底的氢化辅助的高纵横比等离子体蚀刻。深度垂直蚀刻过程包括顺序氧 - 钝化和SF {Sub} 6蚀刻硅,在0.25-0.5w / cm {sup} 2的记录低密度等离子体上(150-300W面积为20×30cm { sup} 2)。同时氢化已被用于刺激硅基板的垂直移除而不损坏侧壁[1]。

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