首页> 外文会议>International Symposium on Defect and Fault-Tolerance in VLSI Systems >Design Space Exploration for the Design of Reliable SRAM-based FPGA Systems
【24h】

Design Space Exploration for the Design of Reliable SRAM-based FPGA Systems

机译:基于可靠的SRAM的FPGA系统设计设计空间探索

获取原文

摘要

This paper presents a design space exploration approach for the design of SRAM -based FPGAs with Single Event Upsets fault mitigation capabilities, exploiting the feature of partial, dynamic reconfiguration ordered by the target platform. In fact, in this scenario, several techniques are available and they can be applied at different granularity levels; thus, we propose a support for exploring the different alternatives by means of a framework taking into account several figures of merit, based on genetic algorithms. The several elements taken into account for evaluating the different solutions are here analyzed and discussed, and the application of the methodology and framework to some case studies is reported, allowing both a tuning of the metrics and the analysis of the identified most interesting solutions, which do not correspond, in general, to the trivial ones.
机译:本文提出了一种设计空间探索方法,用于设计SRAM的FPGA,具有单一事件UPSET故障缓解功能,利用目标平台排序的部分,动态重新配置的功能。实际上,在这种情况下,有几种技术可用,它们可以应用于不同的粒度水平;因此,我们提出了通过考虑到遗传算法的若干优点图的框架来探索不同替代方案的支持。这里考虑到评估不同解决方案的几个元素分析和讨论,并讨论了方法和框架在某些案例研究中的应用,允许调整度量和识别最有趣的解决方案的分析一般来说,不要对应于微不足道的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号