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The Effects of UV Treatment on Thermal and Plasma-Enhanced Atomic Layer Deposition of ZnO Thin Film Transistor

机译:UV处理对ZnO薄膜晶体管热和等离子体增强原子层沉积的影响

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摘要

We investigated the ultraviolet (UV) light photostability of plasma-enhanced and thermal atomic layer deposition of ZnO thin film transistor (TFT). The negative shift of threshold voltage was similarly observed in both cases by UV exposure due to the increment of carrier concentration. Additionally, the transfer curves of TFT using thermal ALD ZnO:N active layer were exhibited recovery characteristics.
机译:我们研究了ZnO薄膜晶体管(TFT)的等离子体增强和热原子层沉积的紫外(UV)光光稳定性。由于载体浓度的增量,通过UV曝光在两种情况下,在两种情况下相似地观察了阈值电压的负变化。另外,使用热ALD ZnO:N有源层的TFT的转移曲线表现出回收特性。

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