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A comparative study of wire bonding versus solder bumping of power semiconductor devices

机译:电力半导体器件电线键合与焊料凸起的比较研究

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摘要

Through a comparative study of wire bonding and solder bumping of power semiconductor devices, the advantages of solder bump interconnection are indicated. Fabrication process, electrical performance, the mal performance as well as reliability issues and results will be presented and compared for these two technologies.
机译:通过对电力半导体器件的引线键合和焊料凸起的比较研究,指示焊料凸块互连的优点。将呈现制造工艺,电气性能,MAL性能以及可靠性问题和结果,并比较这两种技术。

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