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FRACTURE LIFE EVALUATION OF CU-CORED SOLDER JOINT IN BGA PACKAGE

机译:BGA封装中CU焊接点的断裂寿命评估

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A Cu-cored solder joint has an accurate height, a low thermal resistance, and a low electric resistance. However, the fracture mechanism of Cu-cored solder joints has yet to be clarified, and thus the fracture life cannot be predicted. We evaluated the fracture life of Cu-cored solder joints by using our molten-solder-shape analysis and crack-propagation analysis methods. Our molten-solder-shape analysis is based on the moving-particle semi-implicit (MPS) method. In the MPS method, a continuum is expressed as an assembly of particles. In contrast to finite element analysis (FEA), the MPS method can easily express a large deformation and any geometric topology changes, because the continuum does not need to be divided into elements. Using our molten-solder-shape analysis, we could calculate the shapes of Cu-cored solder after the reflow process. Our crack-propagation analysis has a feature where a crack initiation point and the crack propagation paths are automatically calculated and where the fracture life is quantitatively evaluated using FEA. Using our crack-propagation analysis, we could analyze the fracture mechanism of Cu-cored solder joints. By combining our molten-solder-shape and crack-propagation analyses, we could evaluate the fracture life of Cu-cored solder joints in a ball grid array package. As a result, we found that the fracture life of Cu-cored solder joints is longer than that of conventional joints. The height of a joint is one of the reasons for the improved fracture life. Since the height of a Cu-cored solder joint is controlled by the size of the core ball, the height is larger and more highlyaccurate than that in conventional joints. Accordingly, the solder strain and strain variation are decreased. Joint stiffness is the second reason for the improved fracture life. Cu is harder than solder, so the joint stiffness of a Cu-cored joint is greater than that of conventional joints. Accordingly, the displacement of a joint is decreased. The crack-propagation behavior is the third reason for the improved fracture life. In a conventional solder joint, a solder crack only propagates near the interface of the solder and the land. In a Cu-cored solder joint, a solder crack not only propagates near the interface of the solder and the land, but also at the interface of the solder and core ball. The crack-propagation life is longer than that in a conventional joint due to crack-path scattering. We found that the fracture life of Cu-cored solder joints is improved by using these mechanisms.
机译:铜芯焊点具有精确的高度,低的热阻和低的电阻。但是,由于Cu芯钎焊接头的断裂机理尚未明确,因此无法预测断裂寿命。我们使用熔融焊料形状分析和裂纹扩展分析方法评估了铜芯焊点的断裂寿命。我们的熔融焊料形状分析基于移动粒子半隐式(MPS)方法。在MPS方法中,连续体表示为粒子的集合。与有限元分析(FEA)相比,MPS方法可以轻松表示大变形和任何几何拓扑变化,因为不需要将连续体划分为多个元素。使用我们的熔融焊料形状分析,我们可以计算出回流工艺后的铜芯焊料形状。我们的裂纹扩展分析具有自动计算裂纹起始点和裂纹扩展路径以及使用FEA定量评估断裂寿命的功能。使用我们的裂纹扩展分析,我们可以分析铜芯焊点的断裂机理。通过结合我们的熔融焊料形状和裂纹扩展分析,我们可以评估球栅阵列封装中的铜芯焊点的断裂寿命。结果,我们发现铜芯焊料接头的断裂寿命比传统接头更长。接头的高度是延长断裂寿命的原因之一。由于铜芯焊点的高度由芯球的大小控制,因此高度更大且更高 比传统关节更精确。因此,减小了焊料应变和应变变化。接头刚度是延长断裂寿命的第二个原因。 Cu比焊料硬,因此铜芯接头的接头刚度比传统接头大。因此,关节的位移减小。裂纹扩展行为是延长断裂寿命的第三个原因。在传统的焊点中,焊缝仅在焊锡和焊盘的界面附近传播。在铜芯焊点中,焊锡裂纹不仅在焊锡和焊接区的界面附近传播,而且在焊锡和芯球的界面处传播。由于裂纹路径的散布,其裂纹扩展寿命比常规接头长。我们发现通过使用这些机制可以改善铜芯焊点的断裂寿命。

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