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A study of Wafer Level Packaging of SAW filter for module solution

机译:用于模块解决方案的SAW过滤器晶圆级封装的研究

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In the cellular market, the demand for miniaturization becomes more severe year by year. The introduction of multiband and multimode systems has accelerated the need for further miniaturization of RF components. For SAW devices in the RF module function, low insertion loss and high attenuation performance are needed. Moreover, in the structural point, miniaturization and resistance to high molding pressure are demanded. Ceramic packaging with hermetic-sealing has efficient reliability from the structural point of view against molding pressure used in the module fabrication process. However, with the current ceramic packaging method it is difficult to miniaturize the device size. A packaging method using resist with air-gap over the IDT is introduced for further miniaturization. The problem of the resist structure with air-gap is the reliability against humidity and it's strength against deformation. In this paper, we propose an improved method of reliability and strength. The WLP-SAW device for module applications is realized by improving the reliability of IDT and improving the molding resisting pressure of the resist with air-gap. The device size is 0.93×0.92 mm, and the height is 0.4 mm typ.. Moreover, the electrical performance is much improved compared to the current ceramic packaged devices due to the decreased parasitic impedance from the package. In this paper, we would like to discuss the possibility of a SAW device with the resist structure with air-gap. Moreover, we would like to discuss a method to improve the characteristics and molding pressure resistance in WLP.
机译:在蜂窝市场中,对小型化的需求逐年变得越来越严格。多频带和多模式系统的引入加速了对RF组件进一步小型化的需求。对于具有RF模块功能的SAW器件,需要低插入损耗和高衰减性能。此外,在结构上,要求小型化和耐高成型压力。从结构的角度来看,采用气密密封的陶瓷包装具有有效的可靠性,可抵抗模块制造过程中使用的成型压力。然而,利用当前的陶瓷封装方法,难以使装置尺寸最小化。引入了一种在IDT上使用带有气隙的抗蚀剂的封装方法,以实现进一步的小型化。具有气隙的抗蚀剂结构的问题是抗湿的可靠性和抗变形的强度。在本文中,我们提出了一种改进的可靠性和强度方法。用于模块应用的WLP-SAW器件是通过提高IDT的可靠性并通过气隙来提高抗蚀剂的耐模压性而实现的。器件尺寸为0.93×0.92 mm,高度为0.4 mm(典型值)。此外,由于降低了封装的寄生阻抗,与当前的陶瓷封装器件相比,其电气性能有了很大的提高。在本文中,我们想讨论具有带有气隙的抗蚀剂结构的SAW器件的可能性。此外,我们想讨论一种改善WLP的特性和耐模压性的方法。

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