semiconductor device reliability; leakage currents; semiconductor device breakdown; semiconductor device noise; MOSFET; electron traps; semiconductor device measurement; RTS-fluctuations; quantised leakage current switching model; reversible leakage current switching; thin gate oxides; soft breakdown; gate oxide noise; electrically stressed p-MOSFET; inversion mode; gate oxide thickness; reversible switching; hard breakdown; positively charged traps; electron trapping; electron detrapping; pre-breakdown leakage current switching; p-MOSFET reliability; breakdown precursors; bursts; 3.5 nm;
机译:超薄氧化物MOSFET栅极漏电流的噪声模型
机译:使用超薄氧化物MOSFET的栅极泄漏电流的1 / f〜γ噪声的缺陷光谱
机译:重离子,电子或X射线辐照后的超薄栅极氧化物中的场泄漏电流低且发生软击穿
机译:薄栅极氧化物中可逆漏电流切换 - 软咬伤或噪音? MOSFET
机译:MOSFET电流源栅极驱动器,用于MHz开关频率DC-DC转换器的开关损耗建模和频率抖动控制。
机译:面向低电压低能耗的超薄绝缘体上硅MOSFET低频噪声行为的经验和理论模型
机译:带有薄氮化栅氧化物的双栅CMOSFET中应力引起的泄漏电流