首页> 外文会议>Indium Phosphide and Related Materials, 1991., Third International Conference. >P- and n-channel InAlAs/InGaAs heterojunction insulated gate FETs (HIGFETs) on InP
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P- and n-channel InAlAs/InGaAs heterojunction insulated gate FETs (HIGFETs) on InP

机译:InP上的P沟道和N沟道InAlAs / InGaAs异质结绝缘栅FET(HIGFET)

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The simultaneous fabrication of enhancement-mode p-channel and n-channel heterojunction insulated gate FETs (HIGFETs) using InAlAs/InGaAs/InAlAs heterostructure layers on InP substrates is discussed. Near 1- mu m gate length, e-mode p-channel HIGFETs are shown to have a threshold voltage near -0.66 V, sharp pinchoff, 0.9-V gate diode turn-on, and a room-temperature extrinsic transconductance <20 mS/mm. The adjacent (complementary) n-channel HIGFETs are shown to exhibit e-mode operation (threshold V/sub tn/=0.16 V), low leakage, 0.9-V gate diode turn-on, and high transconductance (g/sub m/<320 mS/mm).
机译:讨论了在InP衬底上使用InAlAs / InGaAs / InAlAs异质结构层同时制造增强模式p沟道和n沟道异质结绝缘栅FET(HIGFET)的方法。 e模式p沟道HIGFET的栅极长度接近1μm,其阈值电压接近-0.66 V,尖峰夹断,0.9 V栅极二极管导通,并且室温非本征跨导<20 mS /毫米。相邻(互补)n沟道HIGFET表现出e模式工作(阈值V / sub tn / = 0.16 V),低泄漏,0.9V栅极二极管导通和高跨导(g / sub m / <320 mS / mm)。

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