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Architecture level TSV count minimization methodology for 3D tree-based FPGA

机译:基于3D树的FPGA的体系结构级TSV数最小化方法

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The CMOS technology scaling has greatly improved the overall performance and density of Field Programmable Gate Array (FPGA), nonetheless the performance gap between FPGA and ASIC has remain very wide mainly due the programming overhead of FPGA. Three-Dimensional (3D) integration is a promising technology to reduce wire lengths. Through Silicon Vias (TSV) provide electrical connectivity between multiple active device planes in 3D integrated Circuits (ICs). TSVs require a significant silicon area compared to planar interconnects and also bring critical challenges to design of 3D ICs. In this paper we propose an architectural level TSV count optimization solution to minimize the TSV count without compromising the chip performance. The experimental results shows we are able to minimize 40% of TSV count in 3D Tree-based FPGA.
机译:CMOS技术缩放大大提高了现场可编程门阵列(FPGA)的整体性能和密度,虽然FPGA和ASIC之间的性能差距仍然非常广泛,主要是由于FPGA的编程开销。 三维(3D)集成是一种有希望的技术,可减少线宽。 通过硅通孔(TSV)提供3D集成电路(IC)中的多个有源器件平面之间的电连接。 与平面互连相比,TSV需要一个重要的硅区域,并对3D IC的设计带来了关键挑战。 在本文中,我们提出了一种架构级TSV计数优化解决方案,以最小化TSV计数而不影响芯片性能。 实验结果表明,我们能够最小化3D基于树的FPGA中的40%TSV计数。

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