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Architecture level TSV count minimization methodology for 3D tree-based FPGA

机译:基于3D树的FPGA的体系结构级TSV计数最小化方法

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The CMOS technology scaling has greatly improved the overall performance and density of Field Programmable Gate Array (FPGA), nonetheless the performance gap between FPGA and ASIC has remain very wide mainly due the programming overhead of FPGA. Three-Dimensional (3D) integration is a promising technology to reduce wire lengths. Through Silicon Vias (TSV) provide electrical connectivity between multiple active device planes in 3D integrated Circuits (ICs). TSVs require a significant silicon area compared to planar interconnects and also bring critical challenges to design of 3D ICs. In this paper we propose an architectural level TSV count optimization solution to minimize the TSV count without compromising the chip performance. The experimental results shows we are able to minimize 40% of TSV count in 3D Tree-based FPGA.
机译:CMOS技术的扩展极大地改善了现场可编程门阵列(FPGA)的整体性能和密度,但主要由于FPGA的编程开销,FPGA与ASIC之间的性能差距仍然很大。三维(3D)集成是减少导线长度的一项有前途的技术。硅通孔(TSV)可以在3D集成电路(IC)中的多个有源器件平面之间提供电连接。与平面互连相比,TSV需要大量的硅面积,并且也给3D IC的设计带来了严峻的挑战。在本文中,我们提出了一种架构级别的TSV计数优化解决方案,以在不影响芯片性能的情况下最小化TSV计数。实验结果表明,我们能够在基于3D Tree的FPGA中最小化40%的TSV数量。

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