首页> 外文会议>IEEE Annual Wireless and Microwave Technology Conference >A general and reliable model for GaN HEMTs on Si and SiC substrates
【24h】

A general and reliable model for GaN HEMTs on Si and SiC substrates

机译:Si和SiC衬底上的GaN HEMT的通用可靠模型

获取原文

摘要

In this paper a reliable and cost-effective modeling approach for GaN HEMT on both Si and SiC substrates is presented. The developed model is validated in terms of small-and large-signal simulations for 2-mm GaN-on-Si and 1-mm GaN-on-SiC HEMTs.
机译:本文提出了一种在Si和SiC衬底上进行GaN HEMT的可靠且具有成本效益的建模方法。所开发的模型已针对2mm硅基GaN和1mm SiC基GaN HEMT的小信号和大信号仿真进行了验证。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号