首页> 外文会议>Annual IEEE Applied Power Electronics Conference and Exposition >Short circuit characterization of 3rdgeneration 10 kV SiC MOSFET
【24h】

Short circuit characterization of 3rdgeneration 10 kV SiC MOSFET

机译:短路表征3 RD 生成10 kV SIC MOSFET

获取原文

摘要

The short circuit performance of a 3rdgeneration 10 kV/20 A SiC MOSFET with short channel is characterized in this paper. The platform consisting of a phase-leg configuration, which can test both hard switching fault (HSF) and fault under load (FUL) types of fault, is introduced in detail. A Si IGBT based solid state circuit breaker is developed for short circuit test. The short circuit protection having a response time of 1.5 μs is validated by the test platform. The short circuit characteristics for both the HSF and FUL types at 6 kV DC-link are presented and analyzed.
机译:短路性能3 rd 这篇文章化了10 kV / 20具有短通道的SiC MOSFET。详细地介绍了由相位腿部配置组成的平台,可以详细介绍负载(FUL)故障的硬开关故障(HSF)和故障。基于SI IGBT基固态断路器用于短路测试。测试平台验证具有1.5μs响应时间的短路保护。提出和分析了6 kV DC-Link的HSF和FUR类型的短路特性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号