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Power noise isolation in a silicon interposer with through silicon vias

机译:具有硅通孔的硅中介层中的电源噪声隔离

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In this paper, we present a new structure of a power distribution network (PDN) in silicon interposers with through silicon vias (TSVs) to suppress the high-frequency power/ground noise including simultaneous switching noise. The proposed PDN structure employs the resonant structure consisting of metal patterns and TSVs. To examine the effect of design parameters of the resonant structure on noise suppression characteristics, we present Bloch analysis based on a phase of Bloch impedance and Floquet's theorem. Simulation results show a good correlation between Bloch analysis and a full-wave simulation. Power noise isolation of the proposed PDN structure is verified using full-wave simulations.
机译:在本文中,我们提出了一种具有穿硅通孔(TSV)的硅中介层中配电网络(PDN)的新结构,以抑制包括同步开关噪声在内的高频电源/地噪声。提出的PDN结构采用了由金属图案和TSV组成的谐振结构。为了检查共振结构的设计参数对噪声抑制特性的影响,我们提出了基于Bloch阻抗相位和Floquet定理的Bloch分析。仿真结果表明,Bloch分析与全波仿真之间具有良好的相关性。使用全波仿真验证了所提出的PDN结构的电源噪声隔离。

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