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Room temperature direct bonding and debonding of polymer film on glass wafer for fabrication of flexible electronic devices

机译:玻璃晶片上的高分子温度直接粘接和剥离,用于制造柔性电子器件

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Thin film transistors (TFTs) are playing the critical role in the flexible electronics, and for its fabrication on the polyimide (PI) films it is necessary to fix the PI film on glass wafer and to delaminate the PI film after TFT process. However the current method to bond and debond PI films to glass wafers contains complicated and costly processes. In this study we succeeded in easy bonding and debonding PI films on glass wafers directly by using Si or Cu intermediate layer with Fe ultra-thin layer at room temperature. The Si or Cu layer was deposited on polyimide films and glass wafers by Ar ion beam sputtering, and then film and wafer ware brought into contact and pressed in high vacuum. The bonding strength can be controlled by the bonding condition such as intermediate layer thickness and Fe nano-adhesion layers. Additionally, we made TFT on polyimide films after bonding and evaluated the electric property of the TFT. The polyimide film can be peeled off from glass wafer after TFT process by a load not strong enough to damage the film, and it didn't result in deteriorating the TFT performance.
机译:薄膜晶体管(TFT)正在施加柔性电子器件中的关键作用,并且在聚酰亚胺(PI)膜上的制造是必须在玻璃晶片上固定PI膜并在TFT过程之后分解PI膜。然而,对玻璃晶片的粘合和粘结PI薄膜的目前的方法包含复杂和昂贵的过程。在这项研究中,我们通过在室温下使用Si或Cu中间层直接在玻璃晶片上易于粘接和剥离PI薄膜。通过AR离子束溅射沉积在聚酰亚胺膜和玻璃晶片上的Si或Cu层,然后薄膜和晶片器皿接触并压在高真空中。粘合强度可以通过粘合条件(例如中间层厚度和Fe纳米粘附层)控制。另外,我们在粘接后对聚酰亚胺膜进行TFT,并评估TFT的电特性。在TFT处理之后,可以从载荷不足以损坏薄膜的载荷,可以从玻璃晶片上剥离聚酰亚胺膜,并且不会导致TFT性能恶化。

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