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Three-dimensional simulation of the effects of Cu protrusion of Cu-filled TSVs on thermal fatigue behavior of micro-bump joints in 3D integration

机译:Cu填充TSV突出对三维集成中微凸块接缝热疲劳行为的影响的三维模拟

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A single-layered TSV structure model without micro-bump joints and a three-layered TSV structure model with micro-bump joints were constructed to simulate the changes of Cu plastic deformation regions and Cu protrusion of Cu-filled TSVs under different thermal cycling conditions, by means of finite element (FE) simulation. On the basis of strain energy theory, the effects of Cu protrusion of Cu-filled TSVs on thermal fatigue behavior of micro-bump joints were investigated. The simulation results manifest that under the thermal cycling with peak temperature 125 °C, the plastic deformation regions mainly locate in Cu pads, while spreading to Cu fillers under the thermal cycling with peak temperature 175 °C, and Cu protrusion height increases with increasing peak temperature. Significantly, it is found that the increase in Cu protrusion leads to the decrease in thermal fatigue life of micro-bump joints.
机译:没有微凸块接头的单层TSV结构模型和具有微凸块接头的三层TSV结构模型,以模拟不同热循环条件下Cu塑性变形区域和Cu填充TSV的Cu突出的变化,通过有限元(FE)仿真。在应变能理论的基础上,研究了Cu填充TSV对微凸块接头的热疲劳行为的影响。模拟结果表明,在峰值温度125℃的热循环下,塑性变形区域主要定位在Cu垫中,同时在峰值温度175°C的热循环下向Cu填充物蔓延,Cu突出高度随着峰值的增加而增加温度。值得注意的是,发现Cu突起的增加导致微凸块接头的热疲劳寿命的降低。

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