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Three-dimensional simulation of the effects of Cu protrusion of Cu-filled TSVs on thermal fatigue behavior of micro-bump joints in 3D integration

机译:3D集成中含铜TSV的铜突起对微凸点热疲劳行为影响的三维模拟

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A single-layered TSV structure model without micro-bump joints and a three-layered TSV structure model with micro-bump joints were constructed to simulate the changes of Cu plastic deformation regions and Cu protrusion of Cu-filled TSVs under different thermal cycling conditions, by means of finite element (FE) simulation. On the basis of strain energy theory, the effects of Cu protrusion of Cu-filled TSVs on thermal fatigue behavior of micro-bump joints were investigated. The simulation results manifest that under the thermal cycling with peak temperature 125 °C, the plastic deformation regions mainly locate in Cu pads, while spreading to Cu fillers under the thermal cycling with peak temperature 175 °C, and Cu protrusion height increases with increasing peak temperature. Significantly, it is found that the increase in Cu protrusion leads to the decrease in thermal fatigue life of micro-bump joints.
机译:构建了无微凸点接头的单层TSV结构模型和具有微凸点接头的三层TSV结构模型,以模拟不同热循环条件下填充Cu的TSV的Cu塑性变形区和Cu突起的变化,通过有限元(FE)模拟。基于应变能理论,研究了填充铜的硅通孔中铜的突出对微凸点接头热疲劳行为的影响。模拟结果表明,在峰值温度为125°C的热循环下,塑性变形区主要位于铜垫上,而在峰值温度为175°C的热循环下,塑性变形区域扩展到Cu填充物,且Cu突起高度随峰值的增加而增加温度。显着地,发现Cu突起的增加导致微凸点接头的热疲劳寿命的降低。

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