首页> 外文会议>Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd >Reliability and microstructural studies of Sn-Ag-Cu lead-free solder joints in pulse-heated reflow soldering
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Reliability and microstructural studies of Sn-Ag-Cu lead-free solder joints in pulse-heated reflow soldering

机译:脉冲加热回流焊中Sn-Ag-Cu无铅焊点的可靠性和微观结构研究

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摘要

With the advent of miniaturization in the electronics industry, the application of flexible interconnections has become necessary and inevitable for many new designs such as flexible circuits (flex) to printed circuit boards (PCB), flex to flex, and multiwire to PCB. Pulse-heated reflow soldering is demonstrably a reliable and repeatable soldering process for manufacturing such products, especially in the attachment of flex-to-PCB in the electronics industry. This paper reports on the microstructure and reliability of flex-to-PCB solder joints. Flex-to-PCB samples were made using Pulse-heated reflow soldering and conventional reflow oven soldering. To study the reliability of the solder joints, three different environmental tests were conducted including thermal shock, thermal humidity, and thermal aging. Microstructural studies and failure analysis were performed on all samples before and after the reliability tests in order to ascertain the cause of failure in both bonding methods. Additionally, a comparison of both attachment methods comprising pulse-heated reflow soldering and reflow oven is presented demonstrating their applicability in manufacturing flex-to-PCB assemblies.
机译:随着电子工业中的小型化的到来,对于许多新设计,例如挠性电路(挠性)至印刷电路板(PCB),挠性至挠性以及多线至PCB的应用,挠性互连的应用已变得必要且不可避免。脉冲加热回流焊显然是一种用于制造此类产品的可靠且可重复的焊接工艺,尤其是在电子行业中的柔性至PCB的连接中。本文报告了柔性PCB焊点的微观结构和可靠性。使用脉冲加热的回流焊和传统的回流焊炉焊来制作柔​​性至PCB的样品。为了研究焊点的可靠性,进行了三种不同的环境测试,包括热冲击,热湿度和热老化。在可靠性测试之前和之后,对所有样品进行了微结构研究和失效分析,以确定两种粘合方法的失效原因。此外,还对包括脉冲加热回流焊和回流焊炉的两种连接方法进行了比较,证明了它们在制造柔性PCB组件中的适用性。

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