Abstract: The work contains results of investigation on the phenomena of the electron emission and photoemission in thin oxide layers in which internal electric field has been generated. Study on secondary electron emission from complex many- layered emitters has led to the discovery of Malter's effect. Basing on it, the sample was a glass with semiconducting films evaporated on its both sides. The internal electric field was created by applying a negative voltage U$-pol$/ to the field electrode. The investigations were performed in the vacuum of the order 10$+$MIN@6$/ Pa. As a result of applying U$-pol$/ and illumination, electrons and photoelectrons are released and recorded as voltage pulses in the multichannel pulse amplitude analyzer. The amplitude spectra N(U) $EQ f(U) for various U$-pol$/ were measured for not illuminated samples and illuminated ones. Electron emission yield dependence on the intensity of an internal field and illumination was measured. With increasing U$-pol$/ the count frequency of pulses grows monotonically. The electric field initiates electron collisions which proceed according to the impact ionization mechanism. Energy analysis of emitted electrons was performed by the retarding field method. Measurements of electron energy in field induced emission showed that about 80 percent of electrons have energy up to 10 eV. !21
展开▼
