首页> 外国专利> METHOD OF CONTROLLING ELECTRIC CONDUCTIVITY OF METAL OXIDE THIN FILM AND THIN FILM TRANSISTOR INCLUDING THE METAL OXIDE THIN FILM HAVING THE CONTROLLED ELECTRIC CONDUCTIVITY

METHOD OF CONTROLLING ELECTRIC CONDUCTIVITY OF METAL OXIDE THIN FILM AND THIN FILM TRANSISTOR INCLUDING THE METAL OXIDE THIN FILM HAVING THE CONTROLLED ELECTRIC CONDUCTIVITY

机译:控制金属氧化物薄膜的电导率的方法和薄膜晶体管,包括具有受控电导率的金属氧化物薄膜

摘要

A method for improving electrical conductivity of a metal oxide thin film is disclosed. The electrical conductivity of the metal oxide thin film can be improved by heat treating the metal oxide thin film and then doping the metal oxide thin film with hydrogen by irradiating the metal oxide thin film with ultraviolet rays in an atmosphere containing water molecules and oxygen molecules. According to this method, the electrical conductivity of the metal oxide thin film can be improved permanently without lowering the transparency.;
机译:公开了一种用于提高金属氧化物薄膜的电导率的方法。通过对金属氧化物薄膜进行热处理,然后通过在包含水分子和氧分子的气氛中用紫外线照射金属氧化物薄膜,可以对金属氧化物薄膜进行氢掺杂,从而提高金属氧化物薄膜的导电性。根据该方法,可以在不降低透明性的情况下永久性地提高金属氧化物薄膜的导电性。

著录项

  • 公开/公告号KR101788929B1

    专利类型

  • 公开/公告日2017-11-15

    原文格式PDF

  • 申请/专利权人 아주대학교산학협력단;

    申请/专利号KR20150136193

  • 发明设计人 서형탁;이상연;김진서;

    申请日2015-09-25

  • 分类号H01L29/786;H01L21/02;H01L29/51;

  • 国家 KR

  • 入库时间 2022-08-21 12:41:38

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