Department of Electronics Communication Saintgits College of Engineering Kottayam India;
Department of Electronics School of Technology Applied Sciences Cochin India;
ageing; logic circuits; low-power electronics; MOSFET; negative bias temperature instability; semiconductor device breakdown; semiconductor device reliability;
机译:正偏置温度不稳定性中的负阈值电压漂移和掺钇的HfO_2栅介质的负偏置温度不稳定性的正阈值电压漂移的研究
机译:负偏置温度不稳定性测量技术的严格研究
机译:通过应力邻近技术改善负偏压温度不稳定性
机译:负偏置温度不稳定性电力降低技术的益处
机译:SiGe PMOS器件上的总电离剂量辐射效应和负偏置温度不稳定性
机译:光激励对insnzno厚度变化薄膜晶体管漏电流和负偏置不稳定性的影响
机译:负偏差温度不稳定性表征技术的发展