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Negative bias temperature instability correction technique for delay locked loop and phase locked loop bias generators
Negative bias temperature instability correction technique for delay locked loop and phase locked loop bias generators
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机译：延迟锁定环和锁相环偏置发生器的负偏置温度不稳定性校正技术
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摘要
A bias generator adjustment system adjusts a PLL or DLL bias generator dependent on negative bias temperature instability effects in an integrated circuit. The bias generator adjustment system uses an aging independent reference circuit and a bias circuit to operatively adjust a bias generator such that transistor aging effects that occur over the lifetime of an integrated circuit are compensated for or corrected.
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