首页> 外文会议>IMAPS 40th international symposium on microelectronics >A Comparison Study of SAC405 and SAC387 Lead-free Solder Ball Alloy Characteristic and Solder Joint System on Ni/Au Finish
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A Comparison Study of SAC405 and SAC387 Lead-free Solder Ball Alloy Characteristic and Solder Joint System on Ni/Au Finish

机译:Ni / Au涂层上SAC405和SAC387无铅焊球合金特性及焊点体系的比较研究

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摘要

In this study,two Sn-Ag-Cu alloys,namely SAC405 & SAC387 were compared in terms of the following characteristics: solder ball surface morphology,solder ball surface cleanliness through Auger elemental depth profile analysis,ball shear strength (at time zero,after test,after multiple reflow and after high temperature storage),IMC morphology and thickness,solderability test and missing ball after functional testing. In terms of surface morphology,SAC405 was found to have coarser dendrites on the ball surface that form notches and channels which may trap contamination and prevent the dispense of flux. The finer dendrites on the SAC387 ball surface prevents contamination and flux entrapment,thus prevents voids in the IMC and provides better mechanical strength. Auger elemental depth profile analysis showed higher carbon and oxide level on SAC405 as well as the presence of phosphorus. This may affect IMC formation and affect solder joint performance. With SAC387,lower carbon and oxide level and no phosphorus are found on the surface of the ball. The sharp cliff in the profile of SAC387 suggests that the surface of the solder ball was smoother. In term of ball shear tests,SAC387 had shown significantly higher ball shear strength and Cpk in all the read points. In terms of IMC morphology and thickness,SAC387 has lower IMC growth than SAC405 in most of the read points. In terms of missing ball after functional testing,characterization result with ~130units test sample size showed that SAC405 has 0.78% missing ball yield loss at final test whereas SAC387 has zero yield loss. In conclusion,SAC387 solder alloy provides more reliable lead-free solder joint than SAC405.
机译:本研究比较了两种锡-银-铜合金,即SAC405和SAC387,具有以下特征:通过俄歇元素深度分布分析,焊球剪切强度(零时,零后)后的焊球表面形态,焊球表面清洁度测试,多次回流和高温保存后),IMC形态和厚度,可焊性测试和功能测试后的漏球。就表面形态而言,发现SAC405在球表面具有较粗糙的树枝状晶体,这些树枝状晶体会形成凹口和通道,从而可能捕获污染物并阻止焊剂分配。 SAC387球表面上较细的树枝状结晶可防止污染和助焊剂夹带,从而防止IMC中出现空隙并提供更好的机械强度。俄歇元素深度分布分析表明,SAC405上的碳和氧化物含量较高,并且存在磷。这可能会影响IMC的形成并影响焊点性能。使用SAC387时,球表面的碳和氧化物含量较低,并且没有磷。 SAC387轮廓中的陡峭悬崖表明焊球表面更光滑。就球剪切测试而言,SAC387在所有读取点上均显示出明显更高的球剪切强度和Cpk。就IMC的形态和厚度而言,在大多数读取点上,SAC387具有比SAC405更低的IMC增长。就功能测试后的漏球而言,表征〜130个测试样本量的结果表明,SAC405在最终测试中的失球率为0.78%,而SAC387的失球率为零。总之,SAC387焊料合金比SAC405提供了更可靠的无铅焊接点。

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  • 来源
  • 会议地点 San Jose CA(US)
  • 作者单位

    Freescale Semiconductor Malaysia Sdn. Bhd.No. 2, Jalan SS 8/2 Free Industrial Zone Sungei Way Petaling Jaya 47300 Tel: 603-78734247;

    Freescale Semiconductor Inc Corporate Headquarters 6501 William Cannon Drive WestrnAtx, Texas, 78735 USA Tel: 512-895-3517;

    Faculty of Engineering, Department of Electrical, Electronics System;

    Faculty of Science and Technology National University of Malaysia 43600 Bangi, Selangor, MalaysiarnTel: 603-89216322 Fax: 603-89216146 Email: R38158@freescale.com;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 微电子学、集成电路(IC);
  • 关键词

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