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3C-SiC on Si Hetero-epitaxial Growth for Electronic and Biomedical Applications

机译:3C-SiC在硅异质外延生长上的电子和生物医学应用

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摘要

The growth of cubic silicon carbide on silicon, namely 3C-SiC/Si, has been extensively studied at the University of South Florida over the past decade and numerous electronic and biomedical applications explored using this material system. The key step to 3C-SiC devices is the growth of high-quality epitaxial layers of 3C-SiC. In order to improve the manufacturability of future 3C-SiC devices, a simplified 3C-SiC growth process on 50 and 100 mm Si (100) substrates has been developed in a low-pressure horizontal hot-wall chemical vapor deposition (CVD) reactor. A simplified growth process consists of a single thermal ramp to the growth temperature followed by the 3C-SiC growth. The 3C-SiC epitaxial layers were characterized via optical microscopy, secondary electron microscopy (SEM), atomic force microscopy (AFM), X-ray diffraction (XRD), and secondary ion mass spectrometry (SIMS). Examples of biomedical devices realized with this material system are also introduced, including neural probes and in-vitro recording devices, as well as myoglobin and glucose biosensors.
机译:在过去的十年中,南佛罗里达大学已广泛研究了立方碳化硅在硅上的生长,即3C-SiC / Si,并且使用该材料系统探索了许多电子和生物医学应用。 3C-SiC器件的关键步骤是3C-SiC高质量外延层的生长。为了提高未来3C-SiC器件的可制造性,已经在低压水平热壁化学气相沉积(CVD)反应器中开发了在50和100 mm Si(100)衬底上的简化3C-SiC生长工艺。简化的生长过程包括对生长温度进行单一热梯度,然后进行3C-SiC生长。通过光学显微镜,二次电子显微镜(SEM),原子力显微镜(AFM),X射线衍射(XRD)和二次离子质谱(SIMS)对3C-SiC外延层进行了表征。还介绍了用该材料系统实现的生物医学设备的示例,包括神经探针和体外记录设备,以及肌红蛋白和葡萄糖生物传感器。

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  • 会议地点 San Francisco CA(US)
  • 作者单位

    University of South Florida, Dept. of Electrical Engineering, 4202 E. Fowler Ave., Tampa, FL 33620, USA;

    University of South Florida, Dept. of Electrical Engineering, 4202 E. Fowler Ave., Tampa, FL 33620, USA;

    Anvil Semiconductors Ltd, Birmingham Rd., Allesley, Coventry, CV5 9QE, UK;

    University of South Florida, Dept. of Electrical Engineering, 4202 E. Fowler Ave., Tampa, FL 33620, USA;

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