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Critique of High-Frequency Performance of Carbon Nanotube FETs

机译:碳纳米管FET的高频性能的批判

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摘要

The emerging body of literature on the high-frequency performance of carbon nanotube field-effect transistors (CNFETs) is critically reviewed. The focus is on the figure-of-merit f_T, the common-source, short-circuit current gain. The intentions are: to direct attention to the most relevant measured data; to compare this data with record values for other transistors, and with predicted results for CNFETs; to explain the large spread in predicted data; to offer a prognosis for high-frequency CNFETs.
机译:关于碳纳米管场效应晶体管(CNFET)的高频性能的新兴文献受到了严格的审查。重点是品质因数f_T,即共源短路电流增益。目的是:直接关注最相关的测量数据;将该数据与其他晶体管的记录值以及CNFET的预测结果进行比较;解释预测数据的广泛传播;为高频CNFET提供预后。

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