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Microstructural studies of CVD diamond films by transmissin electron microscopy

机译:透射电子显微镜对CVD金刚石膜的显微结构研究

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Microstructural properties of CVD diamond films have been studied by transmission electron microscopy.TEM observations show that the density and distribution of the main structural defects i.e. microtwins and stacking faults are strongly dependent on the film growth textures.A high density of structural defects was observed in films with a carliflower-like defects were mainly located at regions inthe vicinity of grain boundaries,few defects were observed within the main body of the <100> textured crystal grains.
机译:通过透射电子显微镜研究了CVD金刚石膜的微观结构性能.TEM观察表明,主要结构缺陷即微孪晶和堆垛层错的密度和分布在很大程度上取决于膜的生长织构。带有红花状缺陷的薄膜主要位于晶界附近的区域,在<100>织构晶粒的主体内部几乎没有观察到缺陷。

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