首页> 外文会议>Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09 >A Fault Analysis and Classifier Framework for Reliability-Aware SRAM-Based FPGA Systems
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A Fault Analysis and Classifier Framework for Reliability-Aware SRAM-Based FPGA Systems

机译:基于可靠性的基于SRAM的FPGA系统的故障分析和分类器框架

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This paper presents a new framework for the analysis of SRAM-based FPGA systems with respect to their dependability properties against single, multiple and cumulative upsets errors. The aim is to offer an environment for performing fault classification and error propagation analyses for designed featuring fault detection or tolerance techniques against soft errors, where the focus is not only the overall achieved fault coverage, but an understanding of the fault/error relation inside the internal elements of the system. We propose a fault analyzer/classifier laying on top of a classical fault injection engine, used to monitor the evolution of the system after a fault as occurred, with respect to the applied reliability-oriented design technique. The paper introduces the framework and reports some experimental results of its application to a case study, to highlight the benefits of the proposed solution.
机译:本文针对基于SRAM的FPGA系统针对单个,多个和累积翻转错误的可靠性特性,提供了一个新的框架来进行分析。目的是提供一个用于执行故障分类和错误传播分析的环境,以设计具有故障检测或针对软错误的容忍技术的设计,其中的重点不仅在于总体上实现的故障覆盖率,而且在于对内部故障/错误关系的理解。系统的内部元素。我们提出了一种基于经典故障注入引擎的故障分析器/分类器,用于相对于应用的面向可靠性的设计技术来监视故障发生后系统的演变。本文介绍了该框架,并在案例研究中报告了其应用的一些实验结果,以突出提出的解决方案的好处。

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