首页> 外文会议>4th European Conference on Silicon Carbide and Related Materials (ECSCRM 2002); Sep 2-5, 2002; Linkoeping, Sweden >OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension
【24h】

OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension

机译:结终止扩展保护的1.3kV 6H-SiC双极二极管的OBIC测量

获取原文
获取原文并翻译 | 示例

摘要

Silicon carbide has suitable properties for high power electronic applications. We present here results on 6H-SiC bipolar diodes protected by Junction Termination Extension. We have achieved breakdown voltage of ~1200 V, which is close to the theoretical value, and forward current density of 120 A cm~(-2) at 5 V. Optical Beam Induced Current measurements and simulations have shown that JTE are very efficient and that their parameters are close to the optimum. Nevertheless, a little increase of their doping level should increase the breakdown voltage up to ~1400V.
机译:碳化硅具有适合大功率电子应用的特性。我们在此介绍受结终止扩展保护的6H-SiC双极二极管的结果。我们已经达到了接近理论值的〜1200 V击穿电压,在5 V时正向电流密度为120 A cm〜(-2)。光束感应电流的测量和模拟表明JTE非常有效,并且他们的参数接近最佳。但是,只要稍微增加其掺杂水平,击穿电压就会增加到〜1400V。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号