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A Study of GaN HEMTs Current Collapse Impacts on Doherty Multistage PA Linearity

机译:GaN HEMTs电流崩塌对Doherty多级PA线性度影响的研究

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The effect of current collapse with regard to operating class of GaN HEMTs is studied. It is shown that AM-AM deviation due to current collapse is maximized in class AB, while it is reduced under both class A and class C region. A Doherty multi-stage amplifier is designed considering these effects to achieve both high efficiency and linearity. A 2W-class 1.8GHz multistage GaN Doherty PA shows PA chain efficiency of 38% with the power gain of 50.5dB. ACLR of -51dBc is obtained for 20MHz LTE carrier using a commercially available RF predistorter IC.
机译:研究了电流崩塌对GaN HEMT的工作等级的影响。结果表明,由电流崩塌引起的AM-AM偏差在AB类中最大,而在A类和C类区域均减小。考虑到这些影响,设计了Doherty多级放大器以实现高效率和线性度。 2W级1.8GHz多级GaN Doherty PA显示出PA链效率为38%,功率增益为50.5dB。使用市售的RF预失真器IC,对于20MHz LTE载波可获得-51dBc的ACLR。

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