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A Study of GaN HEMTs Current Collapse Impacts on Doherty Multistage PA Linearity

机译:GaN Hemts目前塌陷对Doherty多级PA线性的影响

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The effect of current collapse with regard to operating class of GaN HEMTs is studied. It is shown that AM-AM deviation due to current collapse is maximized in class AB, while it is reduced under both class A and class C region. A Doherty multi-stage amplifier is designed considering these effects to achieve both high efficiency and linearity. A 2W-class 1.8GHz multistage GaN Doherty PA shows PA chain efficiency of 38% with the power gain of 50.5dB. ACLR of -51dBc is obtained for 20MHz LTE carrier using a commercially available RF predistorter IC.
机译:研究了当前崩溃关于GaN Hemts的锻炼类的影响。结果表明,由于电流崩溃引起的AM-AM偏差在AB类中最大化,而在A类和C类别下减少。考虑这些效果,设计了一个深情的多级放大器,以实现高效率和线性。 2W级1.8GHz多级GaN Doherty PA显示PA链效率为38%,功率增益为50.5dB。使用市售的RF预失真器IC获得20MHz LTE载波获得-51DBC的ACLR。

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