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Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs

机译:紫外线和低温对溶液处理的高性能金属氧化物半导体和TFT的影响

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摘要

This paper focuses on ultra-violet (UV)-curing of solution-processed metal-oxide (MO) semiconductors for application in thin film transistors (TFTs). The goal is to combine low-temperature thermal annealing with UV exposure and achieve printable transistors on flexible plastic substrates. In this paper we focus on the use of two different wavelengths of UV and clarify their effect on the performance of the metal-oxide semiconductors. The electrical properties of TFTs made with these semiconductors are characterized. The results show that wavelength of the UV exposure is critical for optimized performance of the semiconductor and the TFTs.
机译:本文致力于溶液处理的金属氧化物(MO)半导体的紫外线(UV)固化,以用于薄膜晶体管(TFT)。目标是将低温热退火与紫外线暴露相结合,并在柔性塑料基板上实现可印刷晶体管。在本文中,我们着重于使用两种不同波长的紫外线,并阐明它们对金属氧化物半导体性能的影响。表征了用这些半导体制成的TFT的电性能。结果表明,紫外线照射的波长对于优化半导体和TFT的性能至关重要。

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