首页> 外文会议>2006 7th International Conference on Electronics Packaging Technology(ICEPT 2006) >Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints
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Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints

机译:本构模型对无铅焊点可靠性的影响

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This paper will focus on the study of solder constitutive model effect on solder joint fatigue life prediction. Two loading conditions are considered, namely thermal cycling and cyclic bending. In this study, four different solder constitutive models including elastic-plastic (EP), elastic-creep (Creep), elastic-plastic-creep (EPC) and viscoplastic Anand's (Anand) models are implemented in FE modeling and simulation for comparison. Two cases involving in Plastic-Ball-Grid-Array (PBGA) assembly subjected to thermal cycling and Very-thin-Quad-Flat-No-lead (VQFN) assembly subjected to cyclic bending are selected for investigating solder constitutive model effect on solder fatigue life and stress-strain behavior. Fatigue life prediction shows that the Creep, EPC and Anand models result in consistent fatigue life for PBGA assembly. When using EPC model, the creep deformation is dominant for PBGA assembly. For cyclic bending study for VQFN assembly, the significant different simulation result can be found when using different constitutive models. Results show that EP and EPC model can lead to similar result and accumulated strain energy density per cycle is easier to converge, while Creep model is equivalent to Anand's model which result in lower strain energy density value for high temperature bending. The thermal cycling fatigue test data for PBGA is also presented for validating FE simulation results.
机译:本文将重点研究焊料本构模型对焊点疲劳寿命预测的影响。考虑了两个加载条件,即热循环和循环弯曲。在这项研究中,在有限元建模和仿真中实现了四种不同的焊料本构模型,包括弹塑性(EP),弹性蠕变(Creep),弹塑性蠕变(EPC)和粘塑性Anand(Anand)模型。选择两种情况,分别进行热循环的塑料球栅阵列(PBGA)组件和经历周期性弯曲的超薄四方形扁平无引线(VQFN)组件,以研究焊料本构模型对焊料疲劳的影响生活和压力应变行为。疲劳寿命预测表明,蠕变,EPC和Anand模型导致PBGA组件具有一致的疲劳寿命。当使用EPC模型时,蠕变变形是PBGA组装的主要因素。对于VQFN组件的循环弯曲研究,当使用不同的本构模型时,可以发现明显不同的仿真结果。结果表明,EP和EPC模型可以得到相似的结果,并且每个周期的累积应变能密度更易于收敛,而Creep模型等效于Anand模型,从而降低了高温弯曲时的应变能密度值。还提供了PBGA的热循环疲劳测试数据,以验证FE仿真结果。

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