首页> 外国专利> INTEGRATED SPACE STRUCTURES WITH RUNDUM GATE, WHICH REFERENCE WITH AN ELECTRICAL SOURCE/DRAIN SUBSTREAT CONTACT

INTEGRATED SPACE STRUCTURES WITH RUNDUM GATE, WHICH REFERENCE WITH AN ELECTRICAL SOURCE/DRAIN SUBSTREAT CONTACT

机译:综合空间结构采用Rundum栅极,其中电源/漏极底物接触的参考

摘要

Round gate structures are described that have devices with an electrical source/drain substrate contact. An integrated circuit structure has a first vertical arrangement of horizontal nanowires over a first Finn. A first gate stack is located above the first vertical arrangement of horizontal nanowires. A first pair of epitactical source or drain struStructures are located at the first and second ends of the first vertical arrangement of horizontal nanowires. One or both of the first pair of epitactical source or drain structures are directly electrically connected to the first Finn. A second vertical arrangement of horizontal nanowires is over a second Finn. A second gate stackis above the second vertical arrangement of horizontal nanowires. A second pair of epitactical source or drain structures are located at the first and second ends of the second vertical arrangement of horizontal nanowires. Both structures of the second pair of epitactical source or drain structures are electrically isolated from the second Finn.
机译:描述圆形栅极结构,其具有具有电源/漏极基板接触的装置。集成电路结构具有第一鳍片的水平纳米线的第一垂直布置。第一栅极堆叠位于水平纳米线的第一垂直布置上方。第一对展开源或漏牙线位于水平纳米线的第一垂直布置的第一和第二端。第一对展开源或漏极结构中的一个或两个直接电连接到第一鳍片。水平纳米线的第二垂直布置在第二鳍片上。高于水平纳米线的第二垂直布置上方的第二栅极堆叠。第二对展开源或漏极结构位于水平纳米线的第二垂直布置的第一和第二端。第二对开关源或排水结构的两个结构与第二鳍片电隔离。

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