1,191,145. Semi-conductor devices. WESTERN ELECTRIC CO. Inc. 7 June, 1967 [8 June, 1966], No. 26187/67. Heading H1K. An N-type GaAs body 21 having a net donor concentration of 10SP16/SP atoms/c.c. or less has an ohmic contact applied thereto comprising an NSP++/SP layer 22 of GaAs having a net donor concentration of the order of 10SP20/SP atoms/c.c., with a metal layer 23 thereon. The body 21 may itself be epitaxially grown on an NSP+/SP GaAs substrate. The preferred method of applying the contact comprises growing the N ++ layer 22 epitaxially from a solution of tin saturated with GaAs (6-10 mole per cent GaAs) produced by melting together a mixture of tin and crushed N-type GaAs, by causing the solution to flow over the cleaned and etched N-type body 21 in a hydrogen atmosphere at 600‹ C., and then cooling. When the temperature reaches 500‹ C. the tin solution is decanted from the body 21 and further cooling takes place in nitrogen. Excess tin/GaAs is removed by heating the body under mercury covered with dil. HCl. The metal layer 23, which may consist of an In/Au alloy, is then formed, e.g. by evaporating In and Au on to the surface of the NSP++/SP layer, and heating so as to alloy them. A tiltable sealed furnace is described for carrying out the epitaxial growth of the NSP++/SP layer 22. This growth may take place through a mask on to a limited region of the body 21.
展开▼
机译:1,191,145。半导体器件。 WESTERN ELECTRIC CO。Inc. 1967年6月7日[1966年6月8日],第26187/67号。标题H1K。 N型GaAs体21的净施主浓度为10 16 SP>原子/c.c。小于或等于其上施加的欧姆接触包括金属层的净施主浓度为10 20 SP>原子/ cc的GaAs N ++ SP>层22 23。主体21本身可以在N + SP> GaAs衬底上外延生长。施加接触的优选方法包括通过使锡和压碎的N型GaAs的混合物熔融在一起而产生的,由饱和的GaAs溶液(6-10%的GaAs)外延生长N ++层22,所述GaAs通过将锡和破碎的N型GaAs的混合物熔融而产生。溶液在600℃的氢气氛中流过经过清洗和腐蚀的N型体21,然后冷却。当温度达到500℃时,从主体21中倒出锡溶液,并在氮气中进一步冷却。通过在覆盖有dil的汞下加热主体,可以去除多余的锡/ GaAs。盐酸。然后形成例如可以由In / Au合金组成的金属层23。通过将In和Au蒸发到N ++ SP>层的表面上,并加热使其合金化。描述了一种可倾斜的密封炉,用于进行N ++ SP>层22的外延生长。该生长可以通过掩模在主体21的有限区域上进行。
展开▼