X-ray analysis apparatus - measures diffused compton radiation with sample in angular position of maximum diffraction

摘要

Apparatus for X-ray analysis of samples (3) contains a crystalline fraction and an amorphous fraction, and is equipped with an X-ray irradiation tube (1) and a sample holder (4). It has an instrument which measures the intensity of diffracted rays (Id) which comprises a diaphragm (8), a crystal monochromator (9) and a radiation counter (10) fixed on a goniometer arm (7) having the same rotational axis (5) as the sample irradiated and equipped with a means of regulating the angular position of the monochromator (9) and the counter (10) w.r.t. the arm (7). An instrument for measuring the intensity of diffused Compton radiation (Ic) is also included and this comprises a diaphragm (13), a selector of frequency band (14) and a counter (15). This is fixed on an arm (12) which can be orientated in the direction of the irradiated sample, making a fixed angle with the incident beam and equipped with a means of regulating the angular position of the frequency band selector (14) and counter (15) w.r.t. the arm (12).