首页> 外国专利> Process for producing bipolar semiconductor device utilizing predeposition of dopant and a polycrystalline silicon-gold film followed by simultaneous diffusion

Process for producing bipolar semiconductor device utilizing predeposition of dopant and a polycrystalline silicon-gold film followed by simultaneous diffusion

机译:利用掺杂剂和多晶硅金膜的预沉积然后同时扩散的双极半导体器件的制造方法

摘要

A process for manufacturing a bipolar semiconductor device. An epitaxial layer is formed on a silicon wafer, and a base layer is formed by the diffusion of impurities having one conductivity type in a part of the epitaxial layer. Impurities having the opposite conductivity type are deposited in a part of the base layer, polycrystalline silicon is deposited on the entire surface of the wafer which is provided with windows for emitter, base and collector electrodes, and a gold-containing film is applied on the entire surface of the polycrystalline silicon layer. Impurities having the opposite conductivity type are deposited and driven into the base layer so as to form an emitter layer and simultaneously gold atoms are driven in through the collector windows into a collector layer of the epitaxial layer and through the base and emitter windows into the collector layer.
机译:一种制造双极半导体器件的方法。在硅晶片上形成外延层,并且通过在外延层的一部分中扩散具有一种导电类型的杂质来形成基础层。具有相反导电类型的杂质沉积在部分基层中,多晶硅沉积在晶片的整个表面上,该晶片设置有用于发射极,基极和集电极的窗口,并且在该表面上施加含金膜多晶硅层的整个表面。具有相反导电类型的杂质被沉积并驱动到基极层中,从而形成发射极层,同时金原子被驱动通过集电极窗口进入外延层的集电极层,并通过基极和发射极窗口进入集电极。层。

著录项

  • 公开/公告号US4290188A

    专利类型

  • 公开/公告日1981-09-22

    原文格式PDF

  • 申请/专利权人 FUJITSU LIMITED;

    申请/专利号US19800116974

  • 申请日1980-01-30

  • 分类号H01L21/283;H01L21/324;

  • 国家 US

  • 入库时间 2022-08-22 14:43:10

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号