SEMICONDUCTOR DEVICE WITH SELF-INSPECTING CIRCUIT

摘要

PURPOSE:To simplify the steps and to improve the efficiency by programming inspecting items, inspecting sequence and inspecting data corresponding to a semiconductor device to be inspected, containing in an apparatus, and inspecting based on them, thereby shortening the inspecting time. CONSTITUTION:A superhigh LSI microprocessor 1 having self-inspecting circuit therein has an ROM3, a controller 5, a calculator 7, a register 9 and a bus controller 11. The inspecting circuit has ROMs 13, 15, a selector 17, and a logic circuit 19. When the processor 1 is set to an inspecting state, an inspection signal is fed through a signal line 23 to the selector 17 to operate the ROM13, decoded by the controller 5, and a command signal is then transmitted to the RAM15. Thereafter, the output is fed to the controller 11 to inspect at every inspecting item according to the sequence, monitored by an inspecting device connected with an external bus 21 to judge whether a semiconductor device to be inspected operates normally by the inspecting device connected to the bus 21.