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Method of laser annealing a subsurface region in a semiconductor

机译:激光退火半导体中的次表面区域的方法

摘要

A method for annealing an ion implanted region (14) buried in a semiconductor substrate (10) without the undesirable effects of thermal diffusion, which includes the radiation of the substrate by a continuous laser having an emission wavelength longer than 600 nm which the buried ion implanted region will absorb strongly but which will be substantially unabsorbed by the unimplanted regions.;Results can be improved when the substrate is heated to approximately 300°C during this laser annealing.
机译:一种用于对掩埋在半导体衬底(10)中的离子注入区(14)进行退火而不会产生不希望的热扩散影响的方法,该方法包括通过发射波长大于600 nm的连续激光对衬底进行辐射,该掩埋离子注入的区域将强烈吸收,但基本上未被未注入的区域吸收。当在该激光退火过程中将衬底加热到​​大约300°C时,可以改善结果。

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