首页> 外国专利> Dry etching method and dry etching apparatus

Dry etching method and dry etching apparatus

机译:干蚀刻方法及干蚀刻装置

摘要

A dry etching method comprises the steps of introducing etching and deposition gases alternately into a reaction chamber (3) at predetermined time intervals, etching the exposed surface of an article (7) to be etched and applying deposition to the surface film thereof alternately by causing the plasma generated by applying power to the etching and deposition gases introduced into the reaction chamber (3) to come into contact with the article (7) to be etched in the reaction chamber (3) in order to etch the surface. The power is applied after the passage of a predetermined time from the start of the introduction of the deposition gas and before the etching gas is introduced, and is cut off when the introduction of the etching gas is suspended.
机译:干法蚀刻方法包括以下步骤:以预定的时间间隔将蚀刻气体和沉积气体交替地引入反应室(3)中;对要蚀刻的物品(7)的暴露表面进行蚀刻;以及通过交替地在其表面膜上进行沉积来进行沉积。通过对引入反应室(3)的蚀刻和沉积气体施加动力而产生的等离子体,该等离子体与要在反应室(3)中被蚀刻的物品(7)接触以蚀刻表面。从开始引入沉积气体起经过预定​​时间之后并且在引入蚀刻气体之前施加功率,并且在中止蚀刻气体的引入时切断功率。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号