首页> 外国专利> METHOD FOR USING ETCHING MASK TO PRODUCE PARTIALLY ETCHED STRUCTURE IN DIRECTIONALLY DETERMINED ETCHING STRUCTURE

METHOD FOR USING ETCHING MASK TO PRODUCE PARTIALLY ETCHED STRUCTURE IN DIRECTIONALLY DETERMINED ETCHING STRUCTURE

机译:在直接确定的刻蚀结构中使用刻蚀面膜生产部分刻蚀结构的方法

摘要

PURPOSE: To etch openings of different depth in a wafer by single step by etching a part of the water anisotropically using an erodable mask material. CONSTITUTION: A first erodable mask layer 18 is formed covering the upper surface of a wafer 10 and patterned to leave the layer 18 at a desired position. A second nonerodable mask layer 22 is then formed thereon covering the first erodable mask layer 18 and patterned to form desired vias, i.e., first via 12 V for terrace 12, second via for V-groove 14 and third via 16 V for through hole 16. When the wafer 10 is immersed into an etching liquid, the etching liquid passes through the water to make through holes 16. Depth and width of the terrace 12 are limited and the terrace 12, V-groove 14 and through hole 16 of desired depth can be obtained by single etching operation.
机译:目的:通过使用可蚀掩模材料各向异性地蚀刻一部分水,通过一步来蚀刻晶圆中不同深度的开口。构成:第一可蚀掩模层18形成为覆盖晶片10的上表面并且被构图以将层18保留在期望的位置。然后在其上形成覆盖第一可蚀掩模层18的第二不可腐蚀掩模层22,并对其进行构图以形成所需的通孔,即,用于平台12的第一通孔12 V,用于V型槽14的第二通孔,用于通孔16的第三通孔16 V当晶片10浸入蚀刻液中时,蚀刻液穿过水以形成通孔16。平台12的深度和宽度受到限制,平台12,V型槽14和期望深度的通孔16被限制。可以通过单次蚀刻操作获得。

著录项

  • 公开/公告号JPH03199051A

    专利类型

  • 公开/公告日1991-08-30

    原文格式PDF

  • 申请/专利权人 XEROX CORP;

    申请/专利号JP19900325152

  • 发明设计人 JIEIMUZU EFU ONIIRU;

    申请日1990-11-27

  • 分类号B41J2/05;B41J2/16;H01L21/308;

  • 国家 JP

  • 入库时间 2022-08-22 06:05:03

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