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High-density wirebond chip interconnect for multi-chip modules

机译:用于多芯片模块的高密度引线键合芯片互连

摘要

A multi-chip module including a multi-layer substrate and a patterned metallization layer formed on each layer of the substrate. A multi-tiered cavity is formed with an integrated circuit (IC) mounting surface at the bottom of the multi-tiered cavity. A plurality of ICs are mounted on the IC mounting surface of the cavity. A first set of wire bonds extends from at least one IC to the exposed portions of patterned metallization of at least two tiers of the multi-tiered cavity. A second set of wire bonds extends from the at least one IC to bond pads of an adjacent IC. A third set of wire bonds extends from the at least one IC to bond pads of the adjacent IC such that the third set of wire bonds has a higher loop height than the second set of wire bonds.
机译:一种多芯片模块,包括多层基板和在该基板的每一层上形成的图案化金属化层。多层腔体在多层腔体的底部形成有集成电路(IC)安装表面。多个IC安装在空腔的IC安装表面上。第一组引线键合从至少一个IC延伸到多层腔体的至少两层的图案化金属化的暴露部分。第二组引线键合从至少一个IC延伸到相邻IC的键合焊盘。第三组引线键合从至少一个IC延伸到相邻IC的键合焊盘,使得第三组引线键合具有比第二组引线键合更高的环路高度。

著录项

  • 公开/公告号US5723906A

    专利类型

  • 公开/公告日1998-03-03

    原文格式PDF

  • 申请/专利权人 HEWLETT-PACKARD COMPANY;

    申请/专利号US19960657582

  • 发明设计人 KENNETH RUSH;

    申请日1996-06-07

  • 分类号H01L23/16;H01L27/10;H01L23/48;H01L23/055;

  • 国家 US

  • 入库时间 2022-08-22 02:40:06

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