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Layout design device and transistor size decisive device of integrated circuit, circuit characteristic evaluation method and transistor size decisive manner

机译:集成电路的布局设计装置和晶体管尺寸决定装置,电路特性评估方法和晶体管尺寸决定方式

摘要

PROBLEM TO BE SOLVED: To more precisely optimize a transistor size in a time shorter than that of a conventional case in the layout design of an integrated circuit. ;SOLUTION: A diffusion sharing estimating means 11 estimates a place, where diffusion is shared in the layout of the integrated circuit, based on circuit data 31. A circuit characteristic evaluating means 12 estimates and evaluates a characteristic, namely, area, delay and power consumption in the integrated circuit by using information on the diffusion sharing place, which is designated by the diffusion sharing estimating means 11. A transistor optimizing means 13 sets the various sizes of respective transistors in the integrated circuit, gives them to the diffusion sharing estimating means 11 and the circuit characteristic evaluating means 12, and selects the optimum transistor size from transistor size candidates which have been set, based on an estimation evaluation result by the circuit characteristic evaluation means 12. Thus, the transistor size can be decided by considering diffusion sharing, and it is not necessary that transistor decision and compacting be repeated as in a conventional case.;COPYRIGHT: (C)1999,JPO
机译:要解决的问题:在比集成电路布图设计的传统情况更短的时间内,更精确地优化晶体管尺寸。 ;解决方案:扩散共享估计装置11基于电路数据31来估计在集成电路的布局中共享扩散的位置。电路特性评估装置12估计并评估特性,即面积,延迟和功率。通过使用由扩散共享估计装置11指定的扩散共享位置上的信息来消耗集成电路中的功耗。晶体管优化装置13设置集成电路中各个晶体管的各种尺寸,并将它们提供给扩散共享估计装置。电路特性评估装置12的估计值与图11所示的电路特性评估装置和电路特性评估装置12的最优选择相比,从已设置的晶体管尺寸候选中选择最佳晶体管尺寸。因此,可以通过考虑扩散共享来确定晶体管尺寸。 ,并且不需要像在co中那样重复晶体管的决定和压缩传统案例;版权:(C)1999,日本特许厅

著录项

  • 公开/公告号JP2872990B2

    专利类型

  • 公开/公告日1999-03-24

    原文格式PDF

  • 申请/专利权人 MATSUSHITA DENKI SANGYO KK;

    申请/专利号JP19980050292

  • 发明设计人 FUKUI MASAHIRO;TANAKA MASAKAZU;

    申请日1998-03-03

  • 分类号H01L27/04;G06F17/50;H01L21/82;H01L21/822;

  • 国家 JP

  • 入库时间 2022-08-22 02:29:32

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