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Layout designing apparatus for integrated circuit, transistor size determining apparatus, circuit characteristic evaluating method, and transistor size determining method

机译:集成电路的布局设计设备,晶体管尺寸确定设备,电路特性评估方法和晶体管尺寸确定方法

摘要

The present invention realizes the optimization of a transistor size with higher precision and in a shorter time, in designing a layout for an integrated circuit. A diffusion sharing estimation section estimates a diffusion-sharing region in the layout of the integrated circuit based on circuit data. A circuit characteristic evaluation section evaluates the characteristics, such as area, delay and power consumption, of the integrated circuit in accordance with the information about the diffusion-sharing region estimated by the diffusion sharing estimation section. A transistor size optimization section sets various size candidates for each of the transistors, which constitute the integrated circuit, provides these size candidates to the diffusion sharing estimation section and the circuit characteristic evaluation section, and then selects an optimum transistor size from the transistor size candidates thus set in accordance with the evaluation results obtained by the circuit characteristic evaluation section. Thus, a transistor size can be determined while taking the diffusion sharing into consideration. In addition, unlike a conventional method, it is no longer necessary to repeatedly re-determine a transistor size and perform a compaction.
机译:在设计集成电路的布局时,本发明实现了高精度和短时间的晶体管尺寸的优化。扩散共享估计部分基于电路数据来估计集成电路的布局中的扩散共享区域。电路特性评估部分根据由扩散共享估计部分估计的关于扩散共享区域的信息来评估集成电路的特性,例如面积,延迟和功耗。晶体管尺寸优化部为构成集成电路的每个晶体管设置各种尺寸候选,将这些尺寸候选提供给扩散共享估计部和电路特性评估部,然后从晶体管尺寸候选中选择最佳晶体管尺寸。因此,根据由电路特性评估部分获得的评估结果来设置。因此,可以在考虑扩散共享的情况下确定晶体管的尺寸。另外,与常规方法不同,不再需要重复重新确定晶体管尺寸并执行紧凑化。

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