首页> 外国专利> Process for charging a substrate wafer onto a heated susceptor or a susceptor segment of a deposition reactor with comprises holding the wafer and susceptor or susceptor segment away from each other before contacting them

Process for charging a substrate wafer onto a heated susceptor or a susceptor segment of a deposition reactor with comprises holding the wafer and susceptor or susceptor segment away from each other before contacting them

机译:将衬底晶片装料到沉积反应器的加热的基座或基座段上的方法,包括在接触晶片和基座或基座段之前使其彼此远离

摘要

Charging a heated susceptor or its segment of a deposition reactor with a substrate wafer on holding device comprises, before contact between substrate wafer and susceptor or its segment, starting a holding position in which wafer and susceptor or its segment are vertically positioned away from each other; and contacting the wafer with susceptor or its segment after a time in holding position. An Independent claim is also included for a device for charging a susceptor or a susceptor segment of a deposition reactor with a substrate wafer lying on a holding device, comprising a lifting cylinder (1) which lifts the susceptor or susceptor segment via a lifting rod (3) and a counter pressure cylinder (2) via which the holding position is adjusted. Preferred Features: The substrate wafer and susceptor or susceptor segment are held in the holding position at a distance of 0.1-100 mm from each other. The time in the holding position is 0.1-100 seconds.
机译:在保持装置上用衬底晶片对沉积反应器的加热的基座或其部分进行充电包括:在衬底晶片与基座或其部分之间接触之前,开始保持位置,在该位置中晶片和基座或其部分彼此垂直地定位;在保持位置一段时间后,使晶片与基座或其部分接触。还包括一种独立权利要求,用于为沉积反应器的基座或基座段上的衬底晶圆放置在固定装置上的装置充电,该装置包括通过升降杆提升基座或基座段的提升缸(1)( 3)和一个反压力缸(2),通过它调整保持位置。优选特征:衬底晶片和基座或基座段被保持在保持位置,彼此之间的距离为0.1-100mm。保持位置的时间为0.1-100秒。

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