Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device

摘要

Laser beam 104 having an irradiation power not less than 1 mW is irradiated onto an observed region, and a variation in a power source current 112 is detected. When the laser beam 104 is irradiated onto a parasitic insulating film 107 which is a parasitic MIM structural spot, the current 112 increases due to a temperature characteristic of the current 112 flowing through the parasitic insulating film 107, whereby the portion of the parasitic MIM structure can be detected. Moreover, laser beam 108 having a wavelength not less than 1.0 &mgr;m is irradiated onto an observed region from the back surface of the chip, and a variation in the power source current is detected. Light having a wavelength not less than 1.0 &mgr;m has the ability to travel through a Si substrate 110 so that the laser beam reaches a wiring portion. Irradiation of the laser beam onto the parasitic insulating film 107 having the parasitic MIM structure increases the current, so that the portion of the parasitic MIM structure can be detected.