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Process and CMOS compatible MEM switches

机译:过程和CMOS兼容MEM开关

摘要

(57) with the processing standard steps for producing a multilayer metal integrated circuits such as CMOS, [Abstract] micro-electro-mechanical (MEM) switch, is produced at low cost. The exact steps, it can be adjusted to match the process of foundry particular, as a result, devices can be integrated easily with other circuits, and low-cost can be obtained. A metal plug that is usually used as a via to connect the metal layer separated by a dielectric layer, the processing step includes making contacts MEM switches. It is formed on both sides of the sacrificial metallization region, then the interconnect metallization is removed from between the contacts via the contact vias such a state that separated the contact vias. The contacts so as to project toward each other, a dielectric surrounding the contacts are etched back. In this way, by activating the MEM switches, when the contact moves towards each other, and firmly connected without interference contact. To form a via in a CMOS process, tungsten is used as a standard, it is a contact material with excellent, it can be used as a contact also via other metals. The interconnect metallization can be used for the request and interconnect on the structural demands of other MEM switches, of which are standard processes and foundries are preferably used. Can be used to make a switch to dielectric materials and various metals, but in a preferred embodiment, interconnect metal layer is aluminum and the dielectric material is SiO 2, 4-layer CMOS manufacturing standard It is a material that conforms fully to the process.
机译:(57)用生产CMOS等多层金属集成电路的加工标准步骤,以低成本生产了[Abstract]微机电(MEM)开关。确切的步骤可以进行调整,以适应特定的铸造工艺,因此,可以轻松地将器件与其他电路集成在一起,并且可以获得低成本。通常用作通孔以连接被介电层分隔的金属层的金属插头,该处理步骤包括制作触点MEM开关。它形成在牺牲金属化区域的两侧,然后经由接触通孔从接触之间去除互连金属化,以使接触通孔分离的状态。触头彼此相对突出,围绕触头的电介质被回蚀。这样,通过激活MEM开关,当触点彼此相对移动时,可以牢固地连接而不会产生干扰触点。为了在CMOS工艺中形成通孔,钨被用作标准材料,它是一种极好的接触材料,它也可以通过其他金属用作接触件。互连金属化可用于请求,并根据其他MEM开关的结构要求进行互连,这些开关是标准工艺,最好使用代工厂。可用于切换到介电材料和各种金属,但在一个优选的实施例中,互连金属层是铝,介电材料是SiO 2, 4层CMOS制造标准完全符合流程。

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