SEMICONDUCTOR INTEGRATED CIRCUIT INCORPORATING SELF-TESTING CIRCUIT, AND METHOD FOR DIAGNOSING FAULT IN THE SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a circuit for performing an inspection in a logic BIST, and to provide a method for easily diagnosing a fault in the logic BIST using the circuit, even when a fault occurs on a scan path.;SOLUTION: Partial scan path selecting information is given to a scan path, formed by alternately connecting a partial scan path formed by the serial connection of a scan FF, and a selector, a specific partial scan path is bypassed, and a scan pattern is applied. Additionally, the state of the scan FF is locked so that an undefined value will not propagate to a combination circuit that should be subjected to a scanning test from the scan FF for composing the bypassed partial scan path. Additionally, a faulty circuit block is specified, by utilizing the partial scan path and testing only the specified circuit block. Additionally, control is made so that only the value of the specified scan FF is propagated to MISR at scanning out.;COPYRIGHT: (C)2005,JPO&NCIPI