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EPITAXIAL SUBSTRATE, MANUFACTURING METHOD OF THE EPITAXIAL SUBSTRATE, METHOD FOR SUPPRESSING WARPAGE OF THE EPITAXIAL SUBSTRATE, AND SEMICONDUCTOR MULTILAYER STRUCTURE USING THE EPITAXIAL SUBSTRATE
EPITAXIAL SUBSTRATE, MANUFACTURING METHOD OF THE EPITAXIAL SUBSTRATE, METHOD FOR SUPPRESSING WARPAGE OF THE EPITAXIAL SUBSTRATE, AND SEMICONDUCTOR MULTILAYER STRUCTURE USING THE EPITAXIAL SUBSTRATE
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机译:表皮基体,表皮基体的制造方法,抑制表皮基体的翘曲的方法以及使用表皮基体的半导体多层结构
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摘要
PROBLEM TO BE SOLVED: To provide a technique for suppressing the warpage of an epitaxial substrate.;SOLUTION: The epitaxial substrate 1 is produced by successively epitaxially growing a target group III-nitride layer 13, an interlayer 14 and a group III-nitride layer 15 on a substrate 11 through a buffer layer 12. The interlayer 14, mainly composed of a mixed crystal of GaN and InN expressed by a general formula (GaxIny) N (0≤x≤1, 0≤y≤1, x+y=1) (or a crystal of GaN), does not contain Al. The interlayer 14 is epitaxially formed at a growth temperature lower than those of the group III-nitride layers 13 and 15, more specifically, at a temperature of 350°C or more and 1,000°C or below.;COPYRIGHT: (C)2005,JPO&NCIPI
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机译:解决的问题:提供一种抑制外延衬底翘曲的技术。解决方案:通过依次外延生长靶III族氮化物层13,中间层14和III族氮化物层来制造外延衬底1。中间层14通过缓冲层12形成在基板11上。中间层14主要由GaN和InN的混合晶体构成,该GaN和InN由通式(Ga x Sub> In y Sub>)表示。 N(0le x≤ 1,0ley≤ 1,x + y = 1)(或GaN晶体)不含Al。中间层14在低于III族氮化物层13和15的生长温度的生长温度下外延形成,更具体地,在350℃以上且1,000℃以下的温度下形成。版权:(C) 2005,日本特许厅
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