首页> 外国专利> A THERMALLY CROSSLINKABLE POLYMER FOR A BOTTOM ANTI-REFLECTIVE COATING FOR PHOTOLITHOGRAPHY, A COMPOSITION FOR PREPARING A BOTTOM ANTI-REFLECTIVE COATING USING THE SAME, AND PREPARATION METHOD THEREOF

A THERMALLY CROSSLINKABLE POLYMER FOR A BOTTOM ANTI-REFLECTIVE COATING FOR PHOTOLITHOGRAPHY, A COMPOSITION FOR PREPARING A BOTTOM ANTI-REFLECTIVE COATING USING THE SAME, AND PREPARATION METHOD THEREOF

机译:用于照相照相术的底部抗反射涂层的热可交联聚合物,用于使用其制备底部抗反射涂层的组合物及其制备方法

摘要

Provided are a polymer, its preparation method, an organic bottom antireflective coating layer composition containing the polymer, and an antireflective coating layer to prevent the reflection of a substrate layer below a photoresist layer for forming a hyperfine circuit during the exposure process using a deep UV of 250 nm or less in the photolithography of a highly integrated semiconductor prepared from the composition. The polymer is represented by the formula 1, wherein R is a benzoin ether, acetophenone or anthracene derivative of an aromatic carbonyl; R1 is H, a C1-C6 alkyl group, a C1-C6 alkoxyalkyl group or a C1-C6 hydroxyalkyl group; R2 is a protected maleimide or furyl group; X is H, a carboxyl group, a hydroxyl group, a furoyl group or a cyanato group; Y is a C1-C6 alkyl group or a phenyl group; x is 0.1-0.5; y is 0-0.6; z is 0-0.3; p is 0.01-0.3; x+y+z+p = 1; and q is an integer of 1-6. Preferably the polymer has a weight average molecular weight of 10,000-100,000.
机译:提供一种聚合物,其制备方法,包含该聚合物的有机底部抗反射涂层组合物,以及用于防止在使用深紫外线的曝光过程中在光致抗蚀剂层下面的基板层反射以形成超细电路的抗反射涂层。在由该组合物制备的高度集成的半导体的光刻中,其波长为250nm或更小。该聚合物由式1表示,其中R是芳族羰基的苯偶姻醚,苯乙酮或蒽衍生物; R 1为H,C 1 -C 6烷基,C 1 -C 6烷氧基烷基或C 1 -C 6羟烷基。 R 2是保护的马来酰亚胺或呋喃基; X为H,羧基,羟基,糠酰基或氰基。 Y为碳数1〜6的烷基或苯基。 x为0.1-0.5; y是0-0.6; z为0-0.3; p为0.01-0.3; x + y + z + p = 1; q是1-6的整数。优选地,聚合物的重均分子量为10,000-100,000。

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